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- DT-155 Intelligent Semiconductor Analyzer
DT-155 Intelligent Semiconductor Analyzer
Intelligent Semiconductor Analyzer The intelligent semiconductor Component analyzer offers great features together with refreshing simplicity. Automatic component type identification Automatic pinout identification, just connect any way round. Special feature identification such as diode protection and resistor shunts. Gain measurement for bipolar transistors. Leakage current measurement for bipolar transistors. Silicon and Germanium detection for bipolar transistors. Gate threshold measurement for Enhancement Mode MOSFETs. Semiconductor forward voltage measurement for diodes, LEDs and transistor Base-Emitter junctions. Automatic and manual power-off. Size (H x W x D): 102mm x 56mm x 24mm Weight: 91g
Intelligent Semiconductor Analyzer
The intelligent semiconductor Component analyzer offers great features together with refreshing simplicity.
Automatic component type identification
Automatic pinout identification, just connect any way round.
Special feature identification such as diode protection and resistor shunts.
Gain measurement for bipolar transistors.
Leakage current measurement for bipolar transistors.
Silicon and Germanium detection for bipolar transistors.
Gate threshold measurement for Enhancement Mode MOSFETs.
Semiconductor forward voltage measurement for diodes, LEDs and transistor Base-Emitter junctions.
Automatic and manual power-off.
Size (H x W x D): 102mm x 56mm x 24mm
Weight: 91g
Features |
Automatic component type identification |
Automatic pinout identification, just connect any way round. |
Special feature identification such as diode protection and resistor shunts. |
Gain measurement for bipolar transistors. |
Leakage current measurement for bipolar transistors. |
Silicon and Germanium detection for bipolar transistors. |
Gate threshold measurement for Enhancement Mode MOSFETs. |
Semiconductor forward voltage measurement for diodes, LEDs and transistor Base-Emitter junctions. |
Automatic and manual power-off. |